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Integrating Reliability Into Microelectronics Manufacturing
Language: en
Pages: 378
Authors: A. Christou
Categories: Technology & Engineering
Type: BOOK - Published: 1994-06-30 - Publisher:

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Details the methods for integrating reliability into manufacturing, providing a methodology for meeting the technological challenges of VLSI and MMIC circuits.
Reliability, Yield, and Stress Burn-In
Language: en
Pages: 407
Authors: Way Kuo
Categories: Technology & Engineering
Type: BOOK - Published: 2013-11-27 - Publisher: Springer Science & Business Media

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The international market is very competitive for high-tech manufacturers to day. Achieving competitive quality and reliability for products requires leader ship
Reliability and Quality in Microelectronic Manufacturing
Language: en
Pages: 410
Authors: A. Christou
Categories: Microelectronics
Type: BOOK - Published: 2006 - Publisher: RIAC

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Microelectronics Failure Analysis
Language: en
Pages: 673
Authors: EDFAS Desk Reference Committee
Categories: Technology & Engineering
Type: BOOK - Published: 2011 - Publisher: ASM International

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Includes bibliographical references and index.
Reliability Engineering
Language: en
Pages: 928
Authors: Elsayed A. Elsayed
Categories: Technology & Engineering
Type: BOOK - Published: 2020-11-10 - Publisher: John Wiley & Sons

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Get a firm handle on the engineering reliability process with this insightful and complete resource The newly and thoroughly revised 3rd Edition of Reliability