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Language: en
Pages: 563
Pages: 563
Type: BOOK - Published: 2010-12-13 - Publisher: Springer Science & Business Media
The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization
Language: en
Pages: 1002
Pages: 1002
Type: BOOK - Published: 2007-04-03 - Publisher: Springer Science & Business Media
This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing
Language: en
Pages: 503
Pages: 503
Type: BOOK - Published: 2006-06-15 - Publisher: Springer Science & Business Media
As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has co
Language: en
Pages: 576
Pages: 576
Type: BOOK - Published: 2016-04-01 - Publisher: Springer
Here is a much-needed general overview of a rapidly developing field. It covers novel scanning probe microscopy (SPM) techniques that are used to characterize a
Language: en
Pages: 555
Pages: 555
Type: BOOK - Published: 2010-12-10 - Publisher: Springer
The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization
