Characterization and Modeling of Charge Trapping and Retention in Novel Multi-dielectric Nonvolatile Semiconductor Memory Devices
| Author | : Anirban Roy |
| Publisher | : |
| Total Pages | : 604 |
| Release | : 1989 |
| ISBN-10 | : OCLC:21928372 |
| ISBN-13 | : |
| Rating | : 4/5 ( Downloads) |
Book Synopsis Characterization and Modeling of Charge Trapping and Retention in Novel Multi-dielectric Nonvolatile Semiconductor Memory Devices by : Anirban Roy
Download or read book Characterization and Modeling of Charge Trapping and Retention in Novel Multi-dielectric Nonvolatile Semiconductor Memory Devices written by Anirban Roy and published by . This book was released on 1989 with total page 604 pages. Available in PDF, EPUB and Kindle. Book excerpt:
