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Language: en
Pages: 252
Pages: 252
Type: BOOK - Published: 2005-12-29 - Publisher: Springer Science & Business Media
Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each
Language: en
Pages: 431
Pages: 431
Type: BOOK - Published: 2006-01-22 - Publisher: Springer Science & Business Media
This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a
Language: en
Pages: 690
Pages: 690
Type: BOOK - Published: 2006-04-11 - Publisher: Springer Science & Business Media
The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there
Language: en
Pages: 80
Pages: 80
Type: BOOK - Published: 2008 - Publisher: KIT Scientific Publishing
Language: en
Pages: 179
Pages: 179
Type: BOOK - Published: 2009-10-08 - Publisher: Springer Science & Business Media
Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects
