Related Books
Language: en
Pages: 329
Pages: 329
Type: BOOK - Published: 1995-11-28 - Publisher: Elsevier
The exploding number of uses for ultrafast, ultrasmall integrated circuits has increased the importance of hot-carrier effects in manufacturing as well as for o
Language: en
Pages: 345
Pages: 345
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media
As device dimensions decrease, hot-carrier effects, which are due mainly to the presence of a high electric field inside the device, are becoming a major design
Language: en
Pages: 518
Pages: 518
Type: BOOK - Published: 2014-10-29 - Publisher: Springer
This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today’s most complicated reliability iss
Language: en
Pages: 223
Pages: 223
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media
As the complexity and the density of VLSI chips increase with shrinking design rules, the evaluation of long-term reliability of MOS VLSI circuits is becoming a
Language: en
Pages: 616
Pages: 616
Type: BOOK - Published: 1989-04-18 - Publisher: John Wiley & Sons
The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits
