Low-frequency Noise Characterization, Evaluation and Modeling of Advanced Si- and SiGe-based CMOS Transistors
| Author | : Martin von Haartman |
| Publisher | : |
| Total Pages | : 124 |
| Release | : 2006 |
| ISBN-10 | : OCLC:185304695 |
| ISBN-13 | : |
| Rating | : 4/5 ( Downloads) |
Book Synopsis Low-frequency Noise Characterization, Evaluation and Modeling of Advanced Si- and SiGe-based CMOS Transistors by : Martin von Haartman
Download or read book Low-frequency Noise Characterization, Evaluation and Modeling of Advanced Si- and SiGe-based CMOS Transistors written by Martin von Haartman and published by . This book was released on 2006 with total page 124 pages. Available in PDF, EPUB and Kindle. Book excerpt:
