This book is intended for readers who are interested in the design of robust and reliable electronic digital systems. The authors cover emerging trends in desig
This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (
This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and miti
Soft errors are a multifaceted issue at the crossroads of applied physics and engineering sciences. Soft errors are by nature multiscale and multiphysics proble
Reliability is a key concern in VLSI systems and transient/intermittent faults, often caused by soft errors, require designers to create special mitigation tech