Test and Diagnosis of Analogue, Mixed-signal and RF Integrated Circuits
Author | : Yichuang Sun |
Publisher | : IET |
Total Pages | : 411 |
Release | : 2008-05-30 |
ISBN-10 | : 9780863417450 |
ISBN-13 | : 0863417450 |
Rating | : 4/5 (450 Downloads) |
Download or read book Test and Diagnosis of Analogue, Mixed-signal and RF Integrated Circuits written by Yichuang Sun and published by IET. This book was released on 2008-05-30 with total page 411 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of those areas. A complete range of circuit components are covered and test issues from the SoC perspective. An essential reference for researchers and engineers in mixed signal testing, postgraduate and senior undergraduate students.