An Experimental Study for the Characterization of Silicon Nitride Films Deposited on Gallium Arsenide Substrates by the R.f. Sputtering Technique Using MIS Structures
| Author | : Mustafa M. El-Muradi |
| Publisher | : |
| Total Pages | : 148 |
| Release | : 1983 |
| ISBN-10 | : OCLC:18554343 |
| ISBN-13 | : |
| Rating | : 4/5 ( Downloads) |
Book Synopsis An Experimental Study for the Characterization of Silicon Nitride Films Deposited on Gallium Arsenide Substrates by the R.f. Sputtering Technique Using MIS Structures by : Mustafa M. El-Muradi
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