Design, Fabrication and Characterization of the Si, GexSi1-x Alloy Dislocation Based Field Effect Transistor

Design, Fabrication and Characterization of the Si, GexSi1-x Alloy Dislocation Based Field Effect Transistor
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Total Pages : 190
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ISBN-10 : OCLC:25352652
ISBN-13 :
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Book Synopsis Design, Fabrication and Characterization of the Si, GexSi1-x Alloy Dislocation Based Field Effect Transistor by : Paul Wai-Hung Chau

Download or read book Design, Fabrication and Characterization of the Si, GexSi1-x Alloy Dislocation Based Field Effect Transistor written by Paul Wai-Hung Chau and published by . This book was released on 1991 with total page 190 pages. Available in PDF, EPUB and Kindle. Book excerpt:


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