Interfacing Defect Qubits with Nanophotonics in Silicon Carbide
Author | : Gregory Richard William Calusine |
Publisher | : |
Total Pages | : 343 |
Release | : 2014 |
ISBN-10 | : 1321567537 |
ISBN-13 | : 9781321567533 |
Rating | : 4/5 (533 Downloads) |
Download or read book Interfacing Defect Qubits with Nanophotonics in Silicon Carbide written by Gregory Richard William Calusine and published by . This book was released on 2014 with total page 343 pages. Available in PDF, EPUB and Kindle. Book excerpt: Defect based qubit systems like the nitrogen vacancy center in diamond have recently emerged as promising candidates for quantum technologies due to their combination of long coherence times, room temperature operation, and robust optical interface. In order to realize many of their proposed applications, defect qubits must be incorporated into scalable devices architectures consisting of photonic, mechanical, or electrical degrees of freedom. Despite much recent progress, many challenges remain for diamond growth and device fabrication. As an alternate approach, we engaged in a search for nitrogen vacancy center analogues in alternative materials with the hope of obtaining a greater degree of control over defect and material properties. Ultimately, we discovered that divacancy-related point defects in all three of the most common forms of silicon carbide- termed 4H, 6H, and 3C- act as analogues to the nitrogen vacancy center in diamond. We chose to focus our research primarily on defects in 3C silicon carbide (termed 'Ky5' defects) because of its availability as a single crystal heteroepitaxial thin film grown on silicon, an advantage that greatly facilitates the fabrication of functional devices. We characterized the spin and optical properties of Ky5 defects in thin film geometries and observed many similarities to the nitrogen vacancy center. We performed the first measurements of spin dynamics in 3C silicon carbide and demonstrate coherent control of defect spins up to room temperature and observe coherence times of up to 22 microseconds.