Materials Reliability in Microelectronics III: Volume 309
Author | : Kenneth P. Rodbell |
Publisher | : |
Total Pages | : 520 |
Release | : 1993-08-31 |
ISBN-10 | : UCSD:31822016911422 |
ISBN-13 | : |
Rating | : 4/5 ( Downloads) |
Book Synopsis Materials Reliability in Microelectronics III: Volume 309 by : Kenneth P. Rodbell
Download or read book Materials Reliability in Microelectronics III: Volume 309 written by Kenneth P. Rodbell and published by . This book was released on 1993-08-31 with total page 520 pages. Available in PDF, EPUB and Kindle. Book excerpt: The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.