Microscopy of Semiconducting Materials 2007

Microscopy of Semiconducting Materials 2007
Author :
Publisher : Springer Science & Business Media
Total Pages : 504
Release :
ISBN-10 : 9781402086151
ISBN-13 : 1402086156
Rating : 4/5 (156 Downloads)

Book Synopsis Microscopy of Semiconducting Materials 2007 by : A.G. Cullis

Download or read book Microscopy of Semiconducting Materials 2007 written by A.G. Cullis and published by Springer Science & Business Media. This book was released on 2008-12-02 with total page 504 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume contains invited and contributed papers presented at the conference on ‘Microscopy of Semiconducting Materials’ held at the University of Cambridge on 2-5 April 2007. The event was organised under the auspices of the Electron Microscopy and Analysis Group of the Institute of Physics, the Royal Microscopical Society and the Materials Research Society. This international conference was the fifteenth in the series that focuses on the most recent world-wide advances in semiconductor studies carried out by all forms of microscopy and it attracted delegates from more than 20 countries. With the relentless evolution of advanced electronic devices into ever smaller nanoscale structures, the problem relating to the means by which device features can be visualised on this scale becomes more acute. This applies not only to the imaging of the general form of layers that may be present but also to the determination of composition and doping variations that are employed. In view of this scenario, the vital importance of transmission and scanning electron microscopy, together with X-ray and scanning probe approaches can immediately be seen. The conference featured developments in high resolution microscopy and nanoanalysis, including the exploitation of recently introduced aberration-corrected electron microscopes. All associated imaging and analytical techniques were demonstrated in studies including those of self-organised and quantum domain structures. Many analytical techniques based upon scanning probe microscopies were also much in evidence, together with more general applications of X-ray diffraction methods.


Microscopy of Semiconducting Materials 2007 Related Books

Microscopy of Semiconducting Materials 2007
Language: en
Pages: 504
Authors: A.G. Cullis
Categories: Technology & Engineering
Type: BOOK - Published: 2008-12-02 - Publisher: Springer Science & Business Media

DOWNLOAD EBOOK

This volume contains invited and contributed papers presented at the conference on ‘Microscopy of Semiconducting Materials’ held at the University of Cambri
The Materials Science of Semiconductors
Language: en
Pages: 629
Authors: Angus Rockett
Categories: Technology & Engineering
Type: BOOK - Published: 2007-11-20 - Publisher: Springer Science & Business Media

DOWNLOAD EBOOK

This book describes semiconductors from a materials science perspective rather than from condensed matter physics or electrical engineering viewpoints. It inclu
Semiconductor Material and Device Characterization
Language: en
Pages: 800
Authors: Dieter K. Schroder
Categories: Technology & Engineering
Type: BOOK - Published: 2015-06-29 - Publisher: John Wiley & Sons

DOWNLOAD EBOOK

This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characteri
Physical Principles of Electron Microscopy
Language: en
Pages: 224
Authors: Ray Egerton
Categories: Technology & Engineering
Type: BOOK - Published: 2011-02-11 - Publisher: Springer Science & Business Media

DOWNLOAD EBOOK

Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor indus
Scanning Probe Microscopy
Language: en
Pages: 1002
Authors: Sergei V. Kalinin
Categories: Technology & Engineering
Type: BOOK - Published: 2007-04-03 - Publisher: Springer Science & Business Media

DOWNLOAD EBOOK

This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing